100×100 mm travel range laser interferometer controlled stage
1nm XY position resolution at any working distance and write field size
Write field from 0.5 µm to 2 µm with automated calibration and selection
User defined write field from 0.5 µm to 2mm with automated calibration and selection
30mm variation in working distance at full interferometric control
20 MHz DSP controlled high speed pattern processor unit with dynamic scan corrections
Compound electromagnetic-electrostatic immersion lens for lower beam aberrations
Stage controlled in closed loop with dc-motor as main drives and shift piezos for fine positioning
3 fold vibration isolation system with pendulum dampers
Raith Nanosuite software: eLine Plus FLEXposure pattering modes, SEM inspection, dimensional metrology software, Pico ampere meter with IEEE-interface, CCD Camera